Yonezawa, Yu
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1

Construction of HILS System for LLC Resonant Converter Usin..:

Funaki, Hideaki ; Noge, Yuichi ; Shoyama, Masahito..
IEEE Transactions on Industry Applications.  60 (2024)  2 - p. 3297-3305 , 2024
 
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2

SiC Power Module Design with a Low-Permittivity Material to..:

, In: 2024 IEEE Applied Power Electronics Conference and Exposition (APEC),
Choi, Sihoon ; Choi, Jiyoon ; Shin, Jong-Won... - p. 1472-1477 , 2024
 
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3

A current fed full bridge converter with auxiliary resonant..:

Yamada, Tomoki ; Yonezawa, Yu ; Yamamoto, Masayoshi
IEICE Electronics Express.  20 (2023)  21 - p. 20230351-20230351 , 2023
 
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4

Analytical Model of Maximum Operating Frequency of Class-D ..:

XIONG, Yi ; THILAK, Senanayake ; YONEZAWA, Yu..
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences.  , 2023
 
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5

Accuracy Improvement of Modeling Method Assisted by Numeric..:

, In: 2023 IEEE Energy Conversion Congress and Exposition (ECCE),
Funaki, Hideaki ; Noge, Yuichi ; Shoyama, Masahito.. - p. 3021-3028 , 2023
 
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6

Real-Time Simulation Method Using LPV Model of LLC Current ..:

, In: 2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia),
Funaki, Hideaki ; Noge, Yuichi ; Shoyama, Masahito. - p. 1809-1816 , 2022
 
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9

Analytical Model of Class-D Inverter for High-frequency Ope..:

, In: IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society,
Xiong, Yi ; Thilak, Senanayake ; Arai, Daisuke... - p. 1-6 , 2022
 
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11

Online Degradation Detection Method for Voltage Regulation ..:

, In: 2018 IEEE Energy Conversion Congress and Exposition (ECCE),
Nakao, Hiroshi ; Yonezawa, Yu ; Nakashima, Yoshiyasu. - p. 4110-4114 , 2018
 
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13

Online Degradation Detection/Prediction Method for Current ..:

Nakao, Hiroshi ; Yonezawa, Yu ; Sugawara, Takahiko..
IEEJ Journal of Industry Applications.  7 (2018)  5 - p. 403-409 , 2018
 
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14

Online Evaluation Method of Electrolytic Capacitor Degradat..:

Nakao, Hiroshi ; Yonezawa, Yu ; Sugawara, Takahiko..
IEEE Transactions on Power Electronics.  33 (2018)  3 - p. 2552-2558 , 2018
 
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15

Failure prediction using low stability phenomenon of digita..:

, In: 2017 IEEE Applied Power Electronics Conference and Exposition (APEC),
Nakao, Hiroshi ; Yonezawa, Yu ; Nakashima, Yoshiyasu. - p. 2323-2328 , 2017
 
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