Yoon, Jeong-Won
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2

Evaluation of high-temperature long-term reliability of tra..:

Heo, Min-Haeng ; Seo, Young-Jin ; Yoon, Jeong-Won
Journal of Materials Science: Materials in Electronics.  35 (2024)  19 - p. , 2024
 
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3

A comparative study of laser soldering and reflow soldering..:

Jeong, Min-Seong ; Heo, Min-Haeng ; Kim, Jungsoo.
Journal of Materials Science: Materials in Electronics.  34 (2023)  28 - p. , 2023
 
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4

Microstructures and mechanical properties of ENIG/Sn-3.5Ag/..:

Kim, Hyeon-Tae ; Yoon, Jeong-Won
Journal of Materials Research and Technology.  24 (2023)  - p. 4468-4483 , 2023
 
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6

Microstructures and mechanical properties of ultrasonic-wel..:

Kim, Hyeon-Tae ; Yoon, Jeong-Won
Journal of Materials Science: Materials in Electronics.  34 (2023)  29 - p. , 2023
 
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7

Transient liquid phase bonding using Cu foam and Cu–Sn past..:

Heo, Min-Haeng ; Seo, Young-Jin ; Yoon, Jeong-Won
Journal of Materials Research and Technology.  27 (2023)  - p. 2856-2867 , 2023
 
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8

Comparative study of solder size and volume effect on prope..:

Seo, Young-Jin ; Heo, Min-Haeng ; Noh, Eun-Chae.
Journal of Materials Science: Materials in Electronics.  34 (2023)  16 - p. , 2023
 
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9

Comparative study of laser- and reflow-soldered Sn–3.0Ag–0...:

Lee, Dong-Hwan ; Jeong, Min-Seong ; Yoon, Jeong-Won
Journal of Materials Science: Materials in Electronics.  34 (2023)  3 - p. , 2023
 
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10

Effects of solder ball size and reflow cycles on properties..:

Noh, Eun-Chae ; Seo, Young-Jin ; Yoon, Jeong-Won
Journal of Materials Science: Materials in Electronics.  34 (2023)  33 - p. , 2023
 
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11

Comparative study of interfacial reaction and bonding prope..:

Lee, Dong-Hwan ; Jeong, Min-Seong ; Yoon, Jeong-Won
Journal of Materials Science: Materials in Electronics.  33 (2022)  10 - p. 7983-7994 , 2022
 
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12

Effects of shear test temperatures and conditions on mechan..:

Heo, Min-Haeng ; Lee, Dong-Hwan ; Jeong, Min-Seong.
Journal of Materials Science: Materials in Electronics.  33 (2022)  13 - p. 10002-10012 , 2022
 
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13

Effects of solder volume and size on microstructures and me..:

Seo, Young-Jin ; Yoon, Jeong-Won
Journal of Materials Science: Materials in Electronics.  33 (2022)  20 - p. 16700-16709 , 2022
 
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15

Intermetallic compound transformation and mechanical streng..:

Jeong, So-Eun ; Yoon, Jeong-Won
Journal of Materials Science: Materials in Electronics.  33 (2022)  9 - p. 6616-6626 , 2022
 
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