E-LIB Suche - Ergebnisse für: Yoon, Jun-Sik

1

Corrections to "Novel Trench Inner-Spacer Scheme to Elimina..:

Jeong, Jinsu ; Yoon, Jun-Sik ; Lee, Sanguk.
IEEE Transactions on Electron Devices. 71 (2024) 7 - p. 4437-4437 , 2024

Link: https://doi.org/10.1109/..

2

Investigation of Program Efficiency Overshoot in 3D Vertica..:

Park, Chanyang ; Yoon, Jun-Sik ; Nam, Kihoon...
Nanomaterials. 13 (2023) 9 - p. 1451 , 2023

Link: https://doi.org/10.3390/..

3

Enhancement of ISPP Efficiency Using Neural Network-Based O..:

Cho, Kyeongrae ; Yun, Hyeok ; Nam, Kihoon...
IEEE Transactions on Electron Devices. 70 (2023) 7 - p. 3504-3510 , 2023

Link: https://doi.org/10.1109/..

4

Novel Trench Inner-Spacer Scheme to Eliminate Parasitic Bot..:

Jeong, Jinsu ; Yoon, Jun-Sik ; Lee, Sanguk.
IEEE Transactions on Electron Devices. 70 (2023) 2 - p. 396-401 , 2023

Link: https://doi.org/10.1109/..

5

Holistic Optimization of Trap Distribution for Performance/..:

Nam, Kihoon ; Park, Chanyang ; Yun, Hyeok...
IEEE Access. 11 (2023) - p. 7135-7144 , 2023

Link: https://doi.org/10.1109/..

6

Optimization of Ge Mole Fraction in Sacrificial Layers for ..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Lee, Sanguk ; Jeong, Jinsu ; Yoon, Jun-Sik... - p. 1-3 , 2023

Link: https://doi.org/10.1109/..

7

Quantitative analysis of irregular channel shape effects on..:

Park, Chanyang ; Yoon, Jun-Sik ; Nam, Kihoon...
Materials Science in Semiconductor Processing. 157 (2023) - p. 107333 , 2023

Link: https://doi.org/10.1016/..

8

Performance, Power, and Area of Standard Cells in Sub 3 nm ..:

Yoon, Jun-Sik ; Jeong, Jinsu ; Lee, Seunghwan...
IEEE Transactions on Electron Devices. 69 (2022) 3 - p. 894-899 , 2022

Link: https://doi.org/10.1109/..

9

Optimal Energetic-Trap Distribution of Nano-Scaled Charge T..:

Nam, Kihoon ; Park, Chanyang ; Yoon, Jun-Sik...
Nanomaterials. 12 (2022) 11 - p. 1808 , 2022

Link: https://doi.org/10.3390/..

10

Bi-Directional Long Short-Term Memory Neural Network Modeli..:

Jang, Hyundong ; Park, Chanyang ; Nam, Kihoon...
IEEE Transactions on Electron Devices. 69 (2022) 8 - p. 4241-4247 , 2022

Link: https://doi.org/10.1109/..

11

Novel Modeling Approach to Analyze Threshold Voltage Variab..:

Lee, Seunghwan ; Yoon, Jun-Sik ; Lee, Junjong...
Nanomaterials. 12 (2022) 10 - p. 1721 , 2022

Link: https://doi.org/10.3390/..

12

Extraction of Device Structural Parameters Through DC/AC Pe..:

Jang, Hyundong ; Yun, Hyeok ; Park, Chanyang...
IEEE Access. 10 (2022) - p. 64408-64419 , 2022

Link: https://doi.org/10.1109/..

13

Whole-brain imaging with receive-only multichannel top-hat ..:

Kumar, Suchit ; Yoon, Jun-Sik ; Kim, Jong-Min..
Journal of the Korean Physical Society. 80 (2022) 9 - p. 920-927 , 2022

Link: https://doi.org/10.1007/..

14

Channel Thickness and Grain Size Engineering for Improvemen..:

Nam, Kihoon ; Park, Chanyang ; Yoon, Jun-Sik...
IEEE Transactions on Electron Devices. 69 (2022) 7 - p. 3681-3687 , 2022

Link: https://doi.org/10.1109/..

15

DC Performance Variations by Grain Boundary in Source/Drain..:

Yoon, Jun-Sik ; Jeong, Jinsu ; Lee, Seunghwan...
IEEE Access. 10 (2022) - p. 22032-22037 , 2022

Link: https://doi.org/10.1109/..