Yoshikawa, Takefumi
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2

A Fractional-N PLL for Multi-phase Clock Generation with Lo..:

, In: 2024 IEEE International Symposium on Circuits and Systems (ISCAS),
Nagasue, Reo ; Mizuno, Isamu ; Kishida, Ryo.. - p. 1-5 , 2024
 
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4

A 13-bit Radiation-Hardened SAR-ADC with Error Correction b..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Aoki, Yuya ; Iwata, Tatsuya ; Miki, Takuji.. - p. 1-8 , 2023
 
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5

Gas discrimination based on enhanced gas-species related in..:

Iwata, Tatsuya ; Saeki, Maaki ; Okura, Yuki.
Sensors and Actuators B: Chemical.  354 (2022)  - p. 131225 , 2022
 
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7

Effect of Complex Permeability on Circuit Parameters of CPW..:

MUROGA, Sho ; TANAKA, Motoshi ; YOSHIKAWA, Takefumi.
IEICE Transactions on Communications.  E103.B (2020)  9 - p. 899-902 , 2020
 
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8

A charge recycling stacked I/O in standard CMOS technology ..:

Yoshikawa, Takefumi ; Iwata, Tatsuya ; Shibazaki, Junji..
IEICE Electronics Express.  17 (2020)  10 - p. 20200112-20200112 , 2020
 
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10

LVDS Transmitter for Cold-Spare Systems in High Flux Enviro..:

, In: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
 
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11

Yield Enhancement of Face-to-Face Cu–Cu Bonding With Dual-M..:

Aung, Myat-Thu-Linn ; Yoshikawa, Takefumi ; Tan, Chuan-Seng.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  25 (2017)  3 - p. 1023-1031 , 2017
 
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12

Session 23 overview: DRAM, MRAM & DRAM interfaces:

, In: 2017 IEEE International Solid-State Circuits Conference (ISSCC),
 
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13

F1: Designing secure systems: Manufacturing, circuits and a..:

, In: 2016 IEEE International Solid-State Circuits Conference (ISSCC),
De, Vivek ; Bernstein, Kerry ; Yoshikawa, Takefumi... - p. 492-494 , 2016
 
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14

2.31-Gb/s/ch Area-Efficient Crosstalk Canceled Hybrid Capac..:

Aung, Myat-Thu-Linn ; Lim, Teck Heng ; Yoshikawa, Takefumi.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  24 (2016)  8 - p. 2703-2711 , 2016
 
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15

Design review on capacitive coupling interconnect for 3DIC:

, In: 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC),
 
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