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Yoshikiyo, Shinsei
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1

Machine Learning-based Accurate Single Wafer Wet Etching Am..:

, In: 2023 Silicon Nanoelectronics Workshop (SNW),
Yoshikiyo, Shinsei ; Horiguchi, Hiroshi ; Matsui, Chihiro. - p. 9-10 , 2023
Link: https://doi.org/10.23919..
 
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2

NN Algorithm Aware Alternate Layer Retraining on Computatio..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Yoshikiyo, Shinsei ; Misawa, Naoko ; Matsui, Chihiro. - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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3

Write Variation & Reliability Error Compensation by Layer-W..:

YOSHIKIYO, Shinsei ; MISAWA, Naoko ; TOPRASERTPONG, Kasidit...
IEICE Transactions on Electronics.  E106.C (2023)  7 - p. 352-364 , 2023
Link: https://doi.org/10.1587/..
 
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4

Edge Computation-in-Memory for In-situ Class-incremental Le..:

, In: 2022 IEEE International Symposium on Circuits and Systems (ISCAS),
Yoshikiyo, Shinsei ; Misawa, Naoko ; Matsui, Chihiro. - p. 2953-2957 , 2022
Link: https://doi.org/10.1109/..
 
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