You, T S
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1

Magnetic properties near the ferromagnetic-paramagnetic tra..:

Nan, W Z ; Thanh, T D ; You, T S..
IOP Conference Series: Materials Science and Engineering.  343 (2018)  - p. 012001 , 2018
 
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2

Critical behavior near the ferromagnetic-paramagnetic trans..:

Nan, W.Z. ; Thanh, Tran Dang ; Nam, G....
Journal of Magnetism and Magnetic Materials.  443 (2017)  - p. 171-178 , 2017
 
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3

Conventional and inverse magnetocaloric effects, and critic..:

Thanh, Tran Dang ; Nan, W.Z. ; Nam, Gnu...
Current Applied Physics.  15 (2015)  10 - p. 1200-1204 , 2015
 
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4

Moisture content determination in single corn kernels by mi..:

Kraszewski, A.W. ; Nelson, S.O. ; You, T.S.
Journal of Agricultural Engineering Research.  48 (1991)  - p. 77-87 , 1991
 
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5

Relationships between microwave permittivities of solid and..:

Nelson, S O ; You, T -S
Journal of Physics D: Applied Physics.  23 (1990)  3 - p. 346-353 , 1990
 
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7

Sarcoidosis in a uterine leiomyoma:

Menzin, A.W. ; You, T.T. ; Deger, R.B...
International Journal of Gynecology & Obstetrics.  48 (1995)  1 - p. 79-84 , 1995
 
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8

MgO/Cu2O Superlattices: Growth of Epitaxial Two-Dimensional..:

Yang, M. J. ; Wadekar, P. V. ; Hsieh, W. C....
Journal of Electronic Materials.  45 (2016)  12 - p. 6285-6291 , 2016
 
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9

An improved technique for the growth of (Tl0.95Bi0.2)(Sr0.8..:

Ji, L ; Yan, S L ; Xie, Q L...
Superconductor Science and Technology.  20 (2007)  12 - p. 1173-1177 , 2007
 
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11

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability ..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Naik, V. B. ; Lim, J. H. ; Yamane, K.... - p. 6B.3-1-6B.3-6 , 2022
 
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12

STT-MRAM Product Reliability and Cross-Talk:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Naik, V. B. ; Yamane, K. ; Kwon, J.... - p. 366-368 , 2022
 
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14

Statin exposure and the risk of dementia in individuals wit..:

Lee, J.‐W. ; Choi, E.‐A. ; Kim, Y.‐S....
Journal of Internal Medicine.  288 (2020)  6 - p. 689-698 , 2020
 
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15

A Reliable TDDB Lifetime Projection Model Verified Using 40..:

, In: 2020 IEEE Symposium on VLSI Technology,
Naik, V. B. ; Yamane, K. ; Lim, J. H.... - p. 1-2 , 2020
 
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