You, Wei-Xiang
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1

Write-enhanced Single-ended 11T SRAM Enabling Single Bitcel..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
You, Wei-Xiang ; Wang, Cheng-Yin ; Wang, Yih.. - p. 1-2 , 2023
 
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2

Mitigating DIBL and Short-Channel Effects for III-V FinFETs..:

Huang, Shih-En ; You, Wei-Xiang ; Su, Pin
IEEE Journal of the Electron Devices Society.  10 (2022)  - p. 65-71 , 2022
 
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3

An Alternative Way for Reconfigurable Logic-in-Memory With ..:

You, Wei-Xiang ; Huang, Bo-Kai ; Su, Pin
IEEE Transactions on Electron Devices.  69 (2022)  1 - p. 444-446 , 2022
 
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4

Comparison of 2-T FeFET Nonvolatile Memory Cells: Gate Sele..:

, In: 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Huang, Bo-Kai ; You, Wei-Xiang ; Su, Pin - p. 1-2 , 2021
 
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5

Simulation and Design of Ultra-Thin-Body FeFET NVMs Conside..:

, In: 2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Wu, Feng-Chi ; You, Wei-Xiang ; Su, Pin - p. 78-79 , 2020
 
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6

A New 8T Hybrid Nonvolatile SRAM With Ferroelectric FET:

You, Wei-Xiang ; Su, Pin ; Hu, Chenming
IEEE Journal of the Electron Devices Society.  8 (2020)  - p. 171-175 , 2020
 
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7

Performance Evaluation of Logic Circuits with 2D Negative-C..:

, In: 2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Lin, Chia-Chen ; Wu, Yi-Jui ; You, Wei-Xiang. - p. 62-63 , 2020
 
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8

Device Structural Effects, SPICE Modeling and Circuit Evalu..:

, In: 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA),
Su, Pin ; You, Wei-Xiang - p. 1-2 , 2019
 
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9

Electrostatic Integrity in Negative-Capacitance FETs – A Su..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Su, Pin ; You, Wei-Xiang - p. 7.3.1-7.3.4 , 2019
 
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10

Evaluation of 2D Negative-Capacitance FETs for Low-Voltage ..:

, In: 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA),
 
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