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Yu, Hengyu
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1

Precise and Fast Real-Time Measurement of Junction Temperat..:

Hu, Bo ; Wang, Jun ; Ke, Zipeng...
IEEE Transactions on Industry Applications.  , 2024
Link: https://doi.org/10.1109/..
 
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2

Investigation of the Electron Trapping in Commercial Thick ..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Qian, Jiashu ; Shi, Limeng ; Jin, Michael... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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3

Modeling of Charge-to-Breakdown with an Electron Trapping M..:

Qian, Jiashu ; Shi, Limeng ; Jin, Michael...
Materials.  17 (2024)  7 - p. 1455 , 2024
Link: https://doi.org/10.3390/..
 
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4

Investigation on gate oxide reliability under gate bias scr..:

Shi, Limeng ; Qian, Jiashu ; Jin, Michael...
Materials Science in Semiconductor Processing.  174 (2024)  - p. 108194 , 2024
Link: https://doi.org/10.1016/..
 
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5

Theoretical Analysis and Experimental Characterization of 1..:

Yu, Hengyu ; Wang, Jun ; Zhang, Jinyi..
IEEE Transactions on Electron Devices.  71 (2024)  3 - p. 1508-1512 , 2024
Link: https://doi.org/10.1109/..
 
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6

Evaluation of Burn-in Technique on Gate Oxide Reliability i..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Shi, Limeng ; Qian, Jiashu ; Jin, Michael... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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7

An Investigation of Body Diode Reliability in Commercial 1...:

Qian, Jiashu ; Shi, Limeng ; Jin, Michael...
Micromachines.  15 (2024)  2 - p. 177 , 2024
Link: https://doi.org/10.3390/..
 
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8

An Effective Screening Technique for Early Oxide Failure in..:

, In: 2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA),
Shi, Limeng ; Qian, Jiashu ; Jin, Michael... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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9

The Effect of Cryogenic Temperature on Subthreshold Hystere..:

, In: 2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA),
Bhattacharya, Monikuntala ; Jin, Michael ; Qian, Jiashu... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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10

Pulse-Voltage Time-Dependent Dielectric Breakdown of Commer..:

, In: 2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA),
Jin, Michael ; Shi, Limeng ; Qian, Jiashu... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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11

Investigation of the Constant Current Stress for Charge-to-..:

, In: 2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA),
Qian, Jiashu ; Shi, Limeng ; Jin, Michael... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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12

Modeling Irradiation-Induced Degradation for 4H-SiC Power M..:

Liang, Shiwei ; Yang, Yu ; Shu, Lei...
IEEE Transactions on Electron Devices.  70 (2023)  3 - p. 1176-1180 , 2023
Link: https://doi.org/10.1109/..
 
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13

SiC Trench MOSFET with Depletion-Mode pMOS for Enhanced Sho..:

Yu, Hengyu ; Shi, Limeng ; Bhattacharya, Monikuntala...
Electronics.  12 (2023)  23 - p. 4764 , 2023
Link: https://doi.org/10.3390/..
 
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14

An integrated dependability guarantee provisioning for clus..:

Wang, Xiaoxuan ; Li, Xuehan ; Jing, Tao.
IET Intelligent Transport Systems.  17 (2023)  9 - p. 1752-1768 , 2023
Link: https://doi.org/10.1049/..
 
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15

Joint timeliness and security provisioning for enhancement ..:

Jing, Tao ; Yu, Hengyu ; Wang, Xiaoxuan.
International Journal of Distributed Sensor Networks.  18 (2022)  6 - p. 155013292211052 , 2022
Link: https://doi.org/10.1177/..
 
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