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Yu, Qingkui
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1

Electron irradiation effects and room-temperature annealing..:

He, Mu ; Dong, Peng ; Ma, Yao...
Results in Physics.  60 (2024)  - p. 107672 , 2024
Link: https://doi.org/10.1016/..
 
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2

Failure analysis of heavy ion-irradiated silicon carbide ju..:

Cao, Shuang ; Yu, Qingkui ; Wang, Qianyuan...
Microelectronics Reliability.  157 (2024)  - p. 115401 , 2024
Link: https://doi.org/10.1016/..
 
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3

Investigation of the synergistic effects on 4H-SiC junction..:

He, Mu ; Dong, Xiaoping ; Xiang, Meiju...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  549 (2024)  - p. 165288 , 2024
Link: https://doi.org/10.1016/..
 
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4

Study on annealing effect of bipolar transistors at differe..:

Mo, Rigen ; Li, Pengwei ; Lyu, He...
Microelectronics Reliability.  150 (2023)  - p. 115125 , 2023
Link: https://doi.org/10.1016/..
 
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5

Displacement Damage Equivalence of Neutron and Proton Radia..:

Liu, Lina ; Mei, Bo ; Zheng, Zhongshan...
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 1885-1891 , 2023
Link: https://doi.org/10.1109/..
 
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6

Special Degradation Effects of 60Co γ-Rays Irradiation on E..:

Feng, Haonan ; Liang, Xiaowen ; Pu, Xiaojuan...
IEEE Transactions on Nuclear Science.  70 (2023)  9 - p. 2165-2174 , 2023
Link: https://doi.org/10.1109/..
 
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7

Experimental study of total ionizing dose effect on SiC MOS..:

Yu, Qingkui ; Cao, Shuang ; Lv, He...
Microelectronics Reliability.  138 (2022)  - p. 114744 , 2022
Link: https://doi.org/10.1016/..
 
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8

Application of Total Ionizing Dose Radiation Test Standards..:

Yu, Qingkui ; Ali, Waqas ; Cao, Shuang...
IEEE Transactions on Nuclear Science.  69 (2022)  5 - p. 1127-1133 , 2022
Link: https://doi.org/10.1109/..
 
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9

Threshold Voltage Shift of SiC MOSFETs Induced by High Temp..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Yu, Qingkui ; Sun, Yi ; Cao, Shuang... - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
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10

Effect of Heavy Ion Irradiation on SiC MOSFET Dynamic Param..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Zhang, Chenrui ; Yu, Qingkui ; Mei, Bo... - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
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11

Effect of gamma irradiation on GaN lateral Schottky barrier..:

Duan, Chao ; Wu, Zhaoxi ; Meng, Meng...
Journal of Physics: Conference Series.  2370 (2022)  1 - p. 012014 , 2022
Link: https://doi.org/10.1088/..
 
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12

Heavy ion radiation and temperature effects on SiC schottky..:

Wang, Duowei ; Hu, Rongbin ; Chen, Gang...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  491 (2021)  - p. 52-58 , 2021
Link: https://doi.org/10.1016/..
 
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13

Research on single event effect test of a RRAM memory and s..:

Lyu, He ; Zhang, Hongwei ; Mei, Bo...
Microelectronics Reliability.  126 (2021)  - p. 114347 , 2021
Link: https://doi.org/10.1016/..
 
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14

Research on Heavy Ion and Proton Irradiation Test of a ReRA..:

, In: 2020 IEEE 5th International Conference on Integrated Circuits and Microsystems (ICICM),
Lv, He ; Zhang, Hongwei ; Mei, Bo... - p. 276-280 , 2020
Link: https://doi.org/10.1109/..
 
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15

Analyzing the impact of soft errors in VGG networks impleme..:

Wei, Jinghe ; Ibrahim, Younis ; Qian, Siyu...
Microelectronics Reliability.  110 (2020)  - p. 113648 , 2020
Link: https://doi.org/10.1016/..
 
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