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YuTsao Hsing
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Economic Analysis of the HOY Wireless Test Methodology:

YuTsao Hsing ; LiMing Denq ; Chao-Hsun Chen.
IEEE Design & Test of Computers.  27 (2010)  3 - p. 20-30 , 2010
Link: https://doi.org/10.1109/..
 
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Hybrid BIST Scheme for Multiple Heterogeneous Embedded Memo..:

Denq, Li-Ming ; Hsing, Yu-Tsao ; Wu, Cheng-Wen
IEEE Design & Test of Computers.  26 (2009)  2 - p. 64-73 , 2009
Link: https://doi.org/10.1109/..
 
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