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Yuan, Sicong
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1

Design-for-Test for Intermittent Faults in STT-MRAMs:

, In: 2024 IEEE European Test Symposium (ETS),
Yuan, Sicong ; Yaldagard, Mohammad Amin ; Xun, Hanzhi... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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2

Online Detection of Unique Faults in RRAMs:

, In: 2024 IEEE European Test Symposium (ETS),
Xun, Hanzhi ; Fieback, Moritz ; Yaldagard, Mohammad Amin... - p. 1-2 , 2024
Link: https://doi.org/10.1109/..
 
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3

Data Background-Based Test Development for All Interconnect..:

, In: 2023 IEEE European Test Symposium (ETS),
Xun, Hanzhi ; Fieback, Moritz ; Yuan, Sicong... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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4

Characterization and Test of Intermittent Over RESET in RRA..:

, In: 2023 IEEE 32nd Asian Test Symposium (ATS),
Xun, Hanzhi ; Fieback, Moritz ; Yuan, Sicong... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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5

Impact of Channel Thickness on the NBTI Behaviors in the Ge..:

Sun, Yu ; Schwarzenbach, Walter ; Yuan, Sicong...
IEEE Journal of the Electron Devices Society.  11 (2023)  - p. 210-215 , 2023
Link: https://doi.org/10.1109/..
 
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6

Device Aware Diagnosis for Unique Defects in STT-MRAMs:

, In: 2023 IEEE 32nd Asian Test Symposium (ATS),
Aouichi, Ahmed ; Yuan, Sicong ; Fieback, Moritz... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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7

Device-Aware Test for Back-Hopping Defects in STT-MRAMs:

, In: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Yuan, Sicong ; Taouil, Mottaqiallah ; Fieback, Moritz... - p. 1-6 , 2023
Link: https://doi.org/10.23919..
 
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8

Device-Aware Test for Ion Depletion Defects in RRAMs:

, In: 2023 IEEE International Test Conference (ITC),
Xun, Hanzhi ; Yuan, Sicong ; Fieback, Moritz... - p. 246-255 , 2023
Link: https://doi.org/10.1109/..
 
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9

For High Frequency 5G Analysis and Predictions for Large Vi..:

, In: 2022 IEEE 2nd International Conference on Electronic Technology, Communication and Information (ICETCI),
Feng, Xiaopeng ; Yuan, Sicong ; Qiu, Sizhe - p. 1072-1075 , 2022
Link: https://doi.org/10.1109/..
 
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10

Mobility enhancement techniques for Ge and GeSn MOSFETs:

Cheng, Ran ; Chen, Zhuo ; Yuan, Sicong...
Journal of Semiconductors.  42 (2021)  2 - p. 023101 , 2021
Link: https://doi.org/10.1088/..
 
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11

Quantitative Evaluation of Mobility Scattering Mechanisms i..:

, In: 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S),
Yuan, Sicong ; Schwarzenbach, Walter ; Chen, Zhuo.. - p. 1-2 , 2019
Link: https://doi.org/10.1109/..
 
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12

Optimizing facility layout planning for reconfigurable manu..:

Wei, Xiaoxiao ; Yuan, Sicong ; Ye, Yuanqin
Production & Manufacturing Research.  7 (2019)  1 - p. 109-124 , 2019
Link: https://doi.org/10.1080/..
 
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13

The implementation of detail de-noising of 3-D model based ..:

, In: 2016 35th Chinese Control Conference (CCC),
Yang, Ying ; Yuan, Sicong ; Jiang, Xiangkui - p. 5093-5098 , 2016
Link: https://doi.org/10.1109/..
 
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14

Synthesis and photoluminescence of quasi-arrayed ZnMgO nano..:

Wang, Fazhan ; Zhao, Chao ; Liu, Bo.
Journal of Physics D: Applied Physics.  42 (2009)  11 - p. 115411 , 2009
Link: https://doi.org/10.1088/..
 
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15

Synthesis and photoluminescence of quasi-arrayed ZnMgO nano..:

Wang, Fazhan ; Zhao, Chao ; Liu, Bo.
Journal of Physics D: Applied Physics.  42 (2009)  20 - p. 209801-209801 , 2009
Link: https://doi.org/10.1088/..
 
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