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Yum, Junghwan
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An Analysis of CDM-induced BTI-like Degradation using VF-TL..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Oh, Sangmin ; Jeong, Taeyoung ; Yum, Junghwan... - p. 1-5 , 2024
Link: https://doi.org/10.1109/..
 
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