E-LIB Suche - Ergebnisse für: Yun, Ilgu

1

Asymmetric and Double-Layered Gate-All- Around Structures o..:

Kwon, Semyung ; Yun, Ilgu
IEEE Transactions on Electron Devices. 71 (2024) 6 - p. 3627-3632 , 2024

Link: https://doi.org/10.1109/..

2

Methodology for Plasma Diagnosis and Accurate Virtual Measu..:

Kim, Dongyoun ; Na, Seunggyu ; Kim, Hyungjun.
IEEE Sensors Journal. 23 (2023) 8 - p. 8867-8875 , 2023

Link: https://doi.org/10.1109/..

3

TFET-Based Pixel Source Follower of CMOS Image Sensor for I..:

Lee, Haewon ; Yun, Ilgu
IEEE Sensors Journal. 23 (2023) 17 - p. 19239-19244 , 2023

Link: https://doi.org/10.1109/..

4

Junction Design Guideline of Silicon Single-Photon Avalanch..:

, In: 2022 IEEE Photonics Conference (IPC),

Lee, Haewon ; Shin, Dongseok ; Choi, Hyejeong. - p. 1-2 , 2022

Link: https://doi.org/10.1109/..

5

Evaluation of the Long-Term Reliability of Open-Tube Diffus..:

Choi, Hyejeong ; Park, Chan-Yong ; Baek, Soo-Hyun..
Electronics. 11 (2022) 5 - p. 802 , 2022

Link: https://doi.org/10.3390/..

6

Introducing the Editorial Board [The Editor's Desk]:

Sheu, Bing ; Kao, Shao-Ku ; Jiang, Xiaoning...
IEEE Nanotechnology Magazine. 16 (2022) 5 - p. 2-8 , 2022

Link: https://doi.org/10.1109/..

7

Self-heating effect of GAAFET and FinFET for over 2-V appli..:

, In: 2022 International Conference on Electronics, Information, and Communication (ICEIC),

Hwang, Seungju ; Yun, Ilgu - p. 1-4 , 2022

Link: https://doi.org/10.1109/..

8

Junction Engineering-Based Modeling and Optimization of Dee..:

Lee, Haewon ; Choi, Hyejeong ; Yun, Ilgu
IEEE Transactions on Electron Devices. 69 (2022) 9 - p. 4970-4975 , 2022

Link: https://doi.org/10.1109/..

9

Advances in Nanotechnology and Applications [Guest Editoria..:

Yun, Ilgu
IEEE Nanotechnology Magazine. 15 (2021) 3 - p. 7-7 , 2021

Link: https://doi.org/10.1109/..

10

Optimization of Self-Heating Driven Leakage Current Propert..:

Park, Chuntaek ; Yun, Ilgu
Electronics. 10 (2021) 21 - p. 2570 , 2021

Link: https://doi.org/10.3390/..

11

Impact of process variability in junctionless FinFETs due t..:

Bae, Min Soo ; Yun, Ilgu
Semiconductor Science and Technology. 35 (2020) 3 - p. 035015 , 2020

Link: https://doi.org/10.1088/..

12

Anaylysis of Mechanism About Data Retention Characteristic ..:

, In: 2020 Pan Pacific Microelectronics Symposium (Pan Pacific),

Lee, Ji-Seok ; Yun, Ilgu - p. 1-8 , 2020

Link: https://doi.org/10.23919..

13

Compact modeling of the subthreshold characteristics of jun..:

Bae, Min Soo ; Yun, Ilgu
Solid-State Electronics. 156 (2019) - p. 48-57 , 2019

Link: https://doi.org/10.1016/..

14

Thermal modeling of 7 nm node bulk fin-shaped field-effect ..:

Park, Chuntaek ; Yun, Ilgu
Semiconductor Science and Technology. 33 (2018) 11 - p. 115014 , 2018

Link: https://doi.org/10.1088/..

15

Real-time plasma monitoring technique using incident-angle-..:

Kim, In Joong ; Yun, Ilgu
Robotics and Computer-Integrated Manufacturing. 52 (2018) - p. 17-23 , 2018

Link: https://doi.org/10.1016/..