E-LIB Suche - Ergebnisse für: ZIELINSKAROHOZINSKA, E

1

Triple axis diffractometric investigations of the microstru..:

Zielinska‐Rohozinska, E. ; Kowalska, M. ; Pakuła, K.
Crystal Research and Technology. 38 (2003) 11 - p. 951-955 , 2003

2

Digitization and image processing methods for enhancement a..:

RHEINLANDER, J ; ABDALI, S ; ZIELINSKAROHOZINSKA, E
Journal of X-Ray Science and Technology. 4 (1994) 2 - p. 130-141 , 1994

Link: https://doi.org/10.1016/..

3

X‐ray Characterization of Defect Structure in LEC Annealed ..:

Czekalski, T. ; Zielińska‐Rohozińska, E.
Crystal Research and Technology. 27 (1992) 7 - p. 947-951 , 1992

Link: https://doi.org/10.1002/..

4

Observations of the Effects of X‐Ray Polarization on Pendel..:

Zielińska‐rohozińska, E.
physica status solidi (b). 28 (1968) 2 - p. , 1968

Link: https://doi.org/10.1002/..

5

Measurement of the Anomalous Absorption Coefficients in the..:

Zielińska‐Rohozińska, E.
physica status solidi (b). 12 (1965) 2 - p. 795-804 , 1965

Link: https://doi.org/10.1002/..

6

Observations of the "Pendellösung" Fringes with the Three‐C..:

Godwood, K. ; Lefeld‐Sosnowska, M. ; Zielińska‐Rohozińska, E.
physica status solidi (b). 7 (1964) 2 - p. 445-448 , 1964

Link: https://doi.org/10.1002/..

7

Schwenkfilm‐Methode und ihre Anwendung bei Untersuchungen d..:

Auleytner, J. ; Zielińska‐Rohozińska, E.
physica status solidi (b). 3 (1963) 10 - p. 1846-1850 , 1963

Link: https://doi.org/10.1002/..

8

Physica status solidi

Volume 7, Number 2: November 1 Physica status solidi ; Volume 7, Number 2

Amelinckx, S ; Art, A ; Baierlein, K... - Reprint 2021 . , [2022]

Link: https://doi.org/10.1515/..

9

Physica status solidi

Volume 59, Number 1: May 16 Physica status solidi ; Volume 59, Number 1, A

Abraimov, V. V ; Aiyer, R ; Al-Mukhtar, J. H... - Reprint 2021 . , [2022]

Link: https://doi.org/10.1515/..

10

Physica status solidi

Volume 28, Number 2: August 1 Physica status solidi ; Volume 28, Number 2, A

Alstkup, I ; Amin, M ; Askerov, B. M... - Reprint 2021 . , [2022]

Link: https://doi.org/10.1515/..

11

High resolution X-ray diffraction study of the Si doping in..:

Harutyunyan, V.S. ; Zielińska-Rohozińska, E. ; Regulska, M.
Journal of Alloys and Compounds. 362 (2004) 1-2 - p. 287-292 , 2004

Link: https://doi.org/10.1016/..

12

High resolution X-ray diffraction defect structure characte..:

Zielińska-Rohozińska, E. ; Regulska, M. ; Harutyunyan, V.S...
Materials Science and Engineering: B. 91-92 (2002) - p. 441-444 , 2002

Link: https://doi.org/10.1016/..

13

Strain relaxation in Ga1−xInxN thin layers grown on GaN sub..:

Zielińska-Rohozińska, E. ; Gronkowski, J. ; Pakuła, K....
Journal of Alloys and Compounds. 328 (2001) 1-2 - p. 199-205 , 2001

Link: https://doi.org/10.1016/..

14

Local order of Te impurity atoms and free electron concentr..:

Slupinski, T ; Zielinska-Rohozinska, E
Thin Solid Films. 367 (2000) 1-2 - p. 227-231 , 2000

Link: https://doi.org/10.1016/..

15

X-ray diffuse scattering characterization of microdefects i..:

Borowski, J ; Gronkowski, J ; Zielinska-Rohozinska, E.
Journal of Physics D: Applied Physics. 31 (1998) 15 - p. 1883-1887 , 1998

Link: https://doi.org/10.1088/..