Zambelli, Cristian
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2

On the Reliability of RRAM-Based Neural Networks:

, In: 2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC),
 
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Exploring the NBTI Aging and PVT effects on RRAM-based FPGA..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
 
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Insights into device and material origins and physical mech..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
 
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Technology-Aware Drift Resilience Analysis of RRAM Crossbar..:

, In: 2023 21st IEEE Interregional NEWCAS Conference (NEWCAS),
 
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Process-Voltage-Temperature Variations Assessment in Energy..:

Rizzi, Tommaso ; Baroni, Andrea ; Glukhov, Artem...
IEEE Transactions on Device and Materials Reliability.  23 (2023)  3 - p. 328-336 , 2023
 
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9

Computational Storage for 3D NAND Flash Error Recovery Flow..:

, In: Lecture Notes in Electrical Engineering; Proceedings of SIE 2023,
Zambelli, Cristian ; Miola, Andrea ; Calore, Enrico.. - p. 425-435 , 2023
 
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11

Experimental verification and benchmark of in-memory princi..:

, In: 2022 IEEE International Symposium on Circuits and Systems (ISCAS),
 
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12

Introduction to 3D NAND Flash Memories:

, In: Machine Learning and Non-volatile Memories,
 
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End-to-end modeling of variability-aware neural networks ba..:

, In: 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC),
Glukhov, Artem ; Lepri, Nicola ; Milo, Valerio... - p. 1-5 , 2022
 
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14

Deep Neural Network Engines Based on Flash Technology:

, In: Machine Learning and Non-volatile Memories,
 
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