E-LIB Suche - Ergebnisse für: Zanotti, Tommaso

1

Guidelines for the Design of Random Telegraph Noise-Based T..:

Zanotti, Tommaso ; Ranjan, Alok ; O'Shea, Sean J....
IEEE Transactions on Device and Materials Reliability. 24 (2024) 2 - p. 184-193 , 2024

Link: https://doi.org/10.1109/..

2

Hardware implementation of a true random number generator i..:

Pazos, Sebastian ; Zheng, Wenwen ; Zanotti, Tommaso...
Nanoscale. 15 (2023) 5 - p. 2171-2180 , 2023

Link: https://doi.org/10.1039/..

3

Biologically plausible information propagation in a complem..:

Benatti, Lorenzo ; Zanotti, Tommaso ; Gandolfi, Daniela..
Nano Futures. 7 (2023) 2 - p. 025003 , 2023

Link: https://doi.org/10.1088/..

4

Reliability Analysis of Random Telegraph Noisebased True Ra..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),

Zanotti, Tommaso ; Ranjan, Alok ; O'Shea, Sean J.... - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

5

Ultra-low power logic in memory with commercial grade memri..:

Benatti, Lorenzo ; Zanotti, Tommaso ; Pavan, Paolo.
Microelectronic Engineering. 280 (2023) - p. 112062 , 2023

Link: https://doi.org/10.1016/..

6

Reliability and Prospects of Logic-in-Memory Circuits:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Zanotti, Tommaso - p. 369-371 , 2022

Link: https://doi.org/10.1109/..

7

Smart Material Implication Using Spin-Transfer Torque Magne..:

De Rose, Raffaele ; Zanotti, Tommaso ; Puglisi, Francesco Maria...
Solid-State Electronics. 194 (2022) - p. 108390 , 2022

Link: https://doi.org/10.1016/..

8

Self-consistent Automated Parameter Extraction of RRAM Phys..:

, In: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC),

Zanotti, Tommaso ; Pavan, Paolo ; Puglisi, Francesco Maria - p. 316-319 , 2022

Link: https://doi.org/10.1109/..

9

Advanced Data Encryption using 2D Materials:

Wen, Chao ; Li, Xuehua ; Zanotti, Tommaso...
Advanced Materials. 33 (2021) 27 - p. , 2021

Link: https://doi.org/10.1002/..

10

Random Telegraph Noise in Metal‐Oxide Memristors for True R..:

Li, Xuehua ; Zanotti, Tommaso ; Wang, Tao...
Advanced Functional Materials. 31 (2021) 27 - p. , 2021

Link: https://doi.org/10.1002/..

11

Energy-Efficient Non-Von Neumann Computing Architecture Sup..:

Zanotti, Tommaso ; Puglisi, Francesco Maria ; Pavan, Paolo
Journal of Low Power Electronics and Applications. 11 (2021) 3 - p. 29 , 2021

Link: https://doi.org/10.3390/..

12

Data Encryption: Advanced Data Encryption using 2D Materia..:

Wen, Chao ; Li, Xuehua ; Zanotti, Tommaso...
Advanced Materials. 33 (2021) 27 - p. , 2021

Link: https://doi.org/10.1002/..

13

Multi-Input Logic-in-Memory for Ultra-Low Power Non-Von Neu..:

Zanotti, Tommaso ; Pavan, Paolo ; Puglisi, Francesco Maria
Micromachines. 12 (2021) 10 - p. 1243 , 2021

Link: https://doi.org/10.3390/..

14

STT-MTJ Based Smart Implication for Energy-Efficient Logic-..:

De Rose, Raffaele ; Zanotti, Tommaso ; Puglisi, Francesco Maria...
Solid-State Electronics. 184 (2021) - p. 108065 , 2021

Link: https://doi.org/10.1016/..

15

Circuit Reliability Analysis of In-Memory Inference in Bina..:

, In: 2020 IEEE International Integrated Reliability Workshop (IIRW),

Zanotti, Tommaso ; Puglisi, Francesco Maria ; Pavan, Paolo - p. 1-5 , 2020

Link: https://doi.org/10.1109/..