Zeng, Lichao
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1

High Performance Wafer Defect Classification Model Based on..:

, In: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC),
 
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8

Uncertainty analysis of measured geometric variations in tu..:

WANG, Xiaojing ; DU, Pengcheng ; YAO, Lichao..
Chinese Journal of Aeronautics.  36 (2023)  6 - p. 140-160 , 2023
 
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10

Application of Decision Tree Classification Algorithm in Po..:

, In: 2023 IEEE World Conference on Applied Intelligence and Computing (AIC),
Zeng, Chaolin ; Zhan, Lichao ; Yang, Yongjiao - p. 938-942 , 2023
 
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11

Comprehensive analysis of the prognosis and immune infiltra..:

Ye, Yintao ; Zhong, Wei ; Qian, Junqiang...
Frontiers in Cell and Developmental Biology.  11 (2023)  - p. , 2023
 
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13

Cobalt nickel sulfide anchored on graphene for high perform..:

Song, Xiumei ; Zhong, Renqi ; Zeng, Yuting..
Diamond and Related Materials.  140 (2023)  - p. 110447 , 2023
 
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