Zenin, V.V.
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12

Analyzing flaws in electric components by scanning acoustic..:

Burov, R. B. ; Stoyanov, A. A. ; Vinokurov, A. A..
Russian Journal of Nondestructive Testing.  53 (2017)  9 - p. 615-619 , 2017
 
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13

Formation of "negative" silicon whiskers:

Nebol'sin, V. A. ; Dunaev, A. I. ; Vorob'ev, A. Yu...
Inorganic Materials.  53 (2017)  8 - p. 775-780 , 2017
 
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