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2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) ,
1
The influence mechanism of Al2O3 layer and etching depth on..:
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2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) ,
2
Investigation of the reverse voltage stress on the fluorine..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
13