E-LIB Suche - Ergebnisse für: Zhou, Longda

1

Convolution-Based Vth Shift Prediction and the New 9T2C Pix..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Xia, Shiyu ; Zhou, Longda ; Wang, Kewei... - p. 1-7 , 2024

Link: https://doi.org/10.1109/..

2

Understanding the Physical Mechanism of RowPress at the Dev..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Zhou, Longda ; Li, Jie ; Ren, Pengpeng... - p. 1-6 , 2024

Link: https://doi.org/10.1109/..

3

Understanding Retention Time Distribution in Buried-Channel..:

Liu, Yong ; Wang, Da ; Ren, Pengpeng...
IEEE Transactions on Electron Devices. , 2024

Link: https://doi.org/10.1109/..

4

Understanding the Competitive Interaction in Leakage Mechan..:

Li, Jie ; Zhou, Longda ; Ye, Sheng..
IEEE Electron Device Letters. 45 (2024) 1 - p. 40-43 , 2024

Link: https://doi.org/10.1109/..

5

Unveiling RowPress in Sub-20 nm DRAM Through Comparative An..:

Zhou, Longda ; Ye, Sheng ; Wang, Runsheng.
IEEE Transactions on Electron Devices. , 2024

Link: https://doi.org/10.1109/..

6

Effectiveness of Repairing Hot Carrier Degradation in Si p-..:

Chang, Hao ; Liu, Qianqian ; Yang, Hong...
IEEE Electron Device Letters. 44 (2023) 3 - p. 372-375 , 2023

Link: https://doi.org/10.1109/..

7

Double-sided Row Hammer Effect in Sub-20 nm DRAM: Physical ..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Zhou, Longda ; Li, Jie ; Qiao, Zheng... - p. 1-10 , 2023

Link: https://doi.org/10.1109/..

8

On the Understanding of Defects in Short-Term Negative Bias..:

Wang, Da ; Zhou, Longda ; Xue, Yongkang...
IEEE Electron Device Letters. 44 (2023) 6 - p. 939-942 , 2023

Link: https://doi.org/10.1109/..

9

Comprehensive Study of NBTI and Off-State Reliabilty in Sub..:

, In: 2023 International Electron Devices Meeting (IEDM),

Sun, Zixuan ; Cai, Puyang ; Song, Jiahao... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

10

Research on the Vortex-induced Vibration of A Cylinder Unde..:

Peng, Di ; Zhou, Longda
Academic Journal of Science and Technology. 7 (2023) 3 - p. 309-312 , 2023

Link: https://doi.org/10.54097..

11

Insight into over Repair of Hot Carrier Degradation by GIDL..:

Chang, Hao ; Wang, Guilei ; Yang, Hong...
Nanomaterials. 13 (2023) 7 - p. 1259 , 2023

Link: https://doi.org/10.3390/..

12

Dependence of short channel length on negative/positive bia..:

Xu, Ren-Ren ; Zhang, Qing-Zhu ; Zhou, Long-Da...
Chinese Physics B. 31 (2022) 1 - p. 017301 , 2022

Link: https://doi.org/10.1088/..

13

Alleviation of Negative-Bias Temperature Instability in Si ..:

Zhou, Longda ; Liu, Qianqian ; Yang, Hong...
IEEE Journal of the Electron Devices Society. 9 (2021) - p. 229-235 , 2021

Link: https://doi.org/10.1109/..

14

Impact of Electron trapping on Energy Distribution Characte..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),

Zhou, Longda ; Zhang, Qingzhu ; Yang, Hong... - p. 1-5 , 2020

Link: https://doi.org/10.1109/..

15

Comparative Study on the Energy Profile of NBTI-Related Def..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),

Zhou, Longda ; Zhang, Qingzhu ; Yang, Hong... - p. 1-6 , 2020

Link: https://doi.org/10.1109/..