E-LIB Suche - Ergebnisse für: Zhou, Xintian

1

Pathogenic bacteria and fungi in bioaerosols from specializ..:

Chen, Lei ; Song, Zhicheng ; Zhou, Xintian..
Environmental Pollution. 341 (2024) - p. 122922 , 2024

2

Optimized Design of Trench Termination for High-Voltage β-G..:

, In: Proceedings of the 2023 7th International Conference on Electronic Information Technology and Computer Engineering,

Zhang, Shiyu ; Hu, Dongqing ; Zhou, Xintian.. - p. 66-72 , 2023

Link: https://dl.acm.org/doi/1..

3

Simulation Study on SEB Resistance of Silicon-based RESURF ..:

, In: 2023 5th International Conference on Power and Energy Technology (ICPET),

Jiang, Jiaye ; Hu, Dongqing ; Li, Rongjia... - p. 198-205 , 2023

Link: https://doi.org/10.1109/..

4

SiC Trench MOSFET With Embedded Schottky Super Barrier Rect..:

Zhou, Xintian ; Zhang, Shida ; Li, Mingwei...
IEEE Transactions on Electron Devices. 70 (2023) 11 - p. 5786-5794 , 2023

Link: https://doi.org/10.1109/..

5

Degradation of VDMOS Under Simultaneous and Sequential Stre..:

Li, Xinyu ; Jia, Yunpeng ; Zhou, Xintian...
IEEE Transactions on Electron Devices. 70 (2023) 6 - p. 2947-2955 , 2023

Link: https://doi.org/10.1109/..

6

Effect of Back-P-Region on Reverse Recovery Oscillation Sup..:

, In: 2023 5th International Conference on Power and Energy Technology (ICPET),

Zou, Hongyu ; Wu, Yu ; He, Feng... - p. 211-216 , 2023

Link: https://doi.org/10.1109/..

7

Numerical demonstration of SiC trench MOSFET with integrate..:

Wang, Lihao ; Jia, Yunpeng ; Zhou, Xintian...
Japanese Journal of Applied Physics. 62 (2023) 4 - p. 044002 , 2023

Link: https://doi.org/10.35848..

8

Improvement of reverse recovery characteristics through int..:

, In: Proceedings of the 2023 7th International Conference on Electronic Information Technology and Computer Engineering,

Zhang, Kang ; Wu, Yu ; Hu, Dongqing.. - p. 1601-1608 , 2023

Link: https://dl.acm.org/doi/1..

9

LOW Inductance High Power IGBT Module:

, In: 2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS),

Zhao, Lei ; Jia, Yunpeng ; Zhou, Xintian. - p. 116-120 , 2023

Link: https://doi.org/10.1109/..

10

Design and simulation study of multi-trench termination for..:

, In: Proceedings of the 2022 6th International Conference on Electronic Information Technology and Computer Engineering,

Zhao, Chongning ; Hu, Dongqing ; Zheng, Yuechao... - p. 498-502 , 2022

Link: https://dl.acm.org/doi/1..

11

Gate Bias Dependence of VTH Degradation in Planar and Trenc..:

Li, Yuan ; Zhou, Xintian ; Zhao, Yuanfu...
IEEE Transactions on Electron Devices. 69 (2022) 5 - p. 2521-2527 , 2022

Link: https://doi.org/10.1109/..

12

Design and Simulation of 1.2kV SiC Super-junction SBD with ..:

, In: 2022 4th International Conference on Power and Energy Technology (ICPET),

Lu, Xiangluan ; Jia, Yunpeng ; Zhou, Xintian... - p. 242-246 , 2022

Link: https://doi.org/10.1109/..

13

Simulation study of 1200V SiC-based trench-gate MOSFET with..:

, In: Proceedings of the 2022 6th International Conference on Electronic Information Technology and Computer Engineering,

Zheng, Yuechao ; Hu, Dongqing ; Zhao, Chongning... - p. 605-610 , 2022

Link: https://dl.acm.org/doi/1..

14

Degradation of 650 V SiC double-trench MOSFETs under repeti..:

Wang, Lihao ; Jia, Yunpeng ; Zhou, Xintian...
Microelectronics Reliability. 133 (2022) - p. 114545 , 2022

Link: https://doi.org/10.1016/..

15

Heavy-ion induced gate damage and thermal destruction in do..:

Wang, Lihao ; Jia, Yunpeng ; Zhou, Xintian...
Microelectronics Reliability. 137 (2022) - p. 114770 , 2022

Link: https://doi.org/10.1016/..