Zhu, Zhengyun
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2

4H-SiC Trench-gate MOSFET with JTE termination:

, In: 2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS),
Zhu, Zhengyun ; Ren, Na ; Xu, Hongyi.. - p. 4-7 , 2023
 
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1.2-kV Planar SiC MOSFETs With Improved Short-Circuit Capab..:

Lin, Chaobiao ; Ren, Na ; Xu, Hongyi...
IEEE Transactions on Electron Devices.  70 (2023)  9 - p. 4730-4736 , 2023
 
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Experimental Investigations on Short-Circuit Capability of ..:

, In: 2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS),
Lin, Chaobiao ; Ren, Na ; Xu, Hongyi.. - p. 22-25 , 2023
 
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Electrical Characterization and Analysis of 4H-SiC Lateral ..:

, In: 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Liu, Li ; Wang, Jue ; Wang, Zishi... - p. 366-369 , 2023
 
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The Impact of the Hexagonal and Circular Cell Designs on th..:

Liu, Li ; Wu, Jiupeng ; Xu, Hongyi...
IEEE Transactions on Electron Devices.  69 (2022)  3 - p. 1226-1232 , 2022
 
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Avalanche Reliability of Planar-gate SiC MOSFET with Varied..:

, In: 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Zhu, Zhengyun ; Ren, Na ; Xu, Hongyi.. - p. 231-234 , 2021
 
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Comparing Hexagonal and Circular Cell designs for SiC MPS D..:

, In: 2021 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia),
Liu, Li ; Ren, Na ; Wu, Jiupeng... - p. 153-156 , 2021
 
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Degradation of 4H-SiC MOSFET body diode under repetitive su..:

, In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Zhu, Zhengyun ; Ren, Na ; Xu, Hongyi... - p. 182-185 , 2020
 
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Reliability Analysis for Commercial SiC MOSFETs in Single P..:

, In: 2020 11th International Conference on Prognostics and System Health Management (PHM-2020 Jinan),
Wu, Hao ; Jiang, Chunyan ; Guo, Qing... - p. 481-485 , 2020
 
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Investigation of Avalanche Capability of 1200V 4H-SiC MPS D..:

, In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Liu, Li ; Ren, Na ; Wu, Jiupeng... - p. 210-213 , 2020
 
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Single Pulse Avalanche Robustness and Analysis for 1200-V S..:

, In: 2020 17th China International Forum on Solid State Lighting & 2020 International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS),
Liu, Li ; Ren, Na ; Zhu, Zhengyun... - p. 90-93 , 2020
 
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