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Zielinska-Rohozinska, E.
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1

Physica status solidi 

Volume 7, Number 2: November 1  Physica status solidi ; Volume 7, Number 2
Amelinckx, S ; Art, A ; Baierlein, K... - Reprint 2021 . , [2022]
Link: https://doi.org/10.1515/..
 
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2

Physica status solidi 

Volume 28, Number 2: August 1  Physica status solidi ; Volume 28, Number 2, A
Alstkup, I ; Amin, M ; Askerov, B. M... - Reprint 2021 . , [2022]
Link: https://doi.org/10.1515/..
 
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3

Physica status solidi 

Volume 59, Number 1: May 16  Physica status solidi ; Volume 59, Number 1, A
Abraimov, V. V ; Aiyer, R ; Al-Mukhtar, J. H... - Reprint 2021 . , [2022]
Link: https://doi.org/10.1515/..
 
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4

High resolution X-ray diffraction study of the Si doping in..:

Harutyunyan, V.S. ; Zielińska-Rohozińska, E. ; Regulska, M.
Journal of Alloys and Compounds.  362 (2004)  1-2 - p. 287-292 , 2004
Link: https://doi.org/10.1016/..
 
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5

High resolution X-ray diffraction defect structure characte..:

Zielińska-Rohozińska, E. ; Regulska, M. ; Harutyunyan, V.S...
Materials Science and Engineering: B.  91-92 (2002)  - p. 441-444 , 2002
Link: https://doi.org/10.1016/..
 
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6

Strain relaxation in Ga1−xInxN thin layers grown on GaN sub..:

Zielińska-Rohozińska, E. ; Gronkowski, J. ; Pakuła, K....
Journal of Alloys and Compounds.  328 (2001)  1-2 - p. 199-205 , 2001
Link: https://doi.org/10.1016/..
 
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7

Local order of Te impurity atoms and free electron concentr..:

Slupinski, T ; Zielinska-Rohozinska, E
Thin Solid Films.  367 (2000)  1-2 - p. 227-231 , 2000
Link: https://doi.org/10.1016/..
 
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8

X-ray diffuse scattering characterization of microdefects i..:

Borowski, J ; Gronkowski, J ; Zielinska-Rohozinska, E.
Journal of Physics D: Applied Physics.  31 (1998)  15 - p. 1883-1887 , 1998
Link: https://doi.org/10.1088/..
 
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9

Characterization of microdefects in GaAs crystals with high..:

Zielińska-Rohozińska, E. ; Słupiński, T. ; Gronkowski, J...
Il Nuovo Cimento D.  19 (1997)  2-4 - p. 625-635 , 1997
Link: https://doi.org/10.1007/..
 
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10

X-ray plane wave topography of annealed silicon crystals us..:

Abdali, S. ; Nielsen, L. ; Zielinska-Rohozinska, E..
Physica Status Solidi (a).  138 (1993)  1 - p. 67-74 , 1993
Link: https://doi.org/10.1002/..
 
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11

X-ray topographic study of defects in annealed silicon:

Gronkowski, J ; Lefeld-Sosnowska, M ; Zielinska-Rohozinska, E
Journal of Physics D: Applied Physics.  26 (1993)  4A - p. A62-A64 , 1993
Link: https://doi.org/10.1088/..
 
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12

X-ray characterization of defect structure in LEC GaAs crys..:

Kowalski, G. ; Zielinska-Rohozinska, E. ; Czekalski, T.
Journal of Crystal Growth.  108 (1991)  3-4 - p. 744-750 , 1991
Link: https://doi.org/10.1016/..
 
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13

X-ray topographic investigation of cellular structure in se..:

Zielińska-Rohozińska, E.
Journal of Crystal Growth.  87 (1988)  1 - p. 154-156 , 1988
Link: https://doi.org/10.1016/..
 
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14

X-Ray Section Topography in the Bragg Case:

, In: May 16,
Zielinska-Rohozinska, E. - p. 317-322 , 1980
Link: https://doi.org/10.1515/..
 
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15

X-ray section topography in the Bragg case:

Zielińska-Rohozińska, E.
Physica Status Solidi (a).  59 (1980)  1 - p. 317-322 , 1980
Link: https://doi.org/10.1002/..
 
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