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Zorian, Yervant
81  results:
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1

Addressing the Combined Effect of Transistor and Interconne..:

, In: 2024 IEEE 42nd VLSI Test Symposium (VTS),
Zhang, Zhe ; Mayahinia, Mahta ; Weis, Christian... - p. 1-5 , 2024
Link: https://doi.org/10.1109/..
 
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2

Innovation Practices Track: Silicon Lifecycle Management Ch..:

, In: 2023 IEEE 41st VLSI Test Symposium (VTS),
Su, Fei ; Jin, Xiankun Robert ; Mukherjee, Nilanjan. - p. 1-1 , 2023
Link: https://doi.org/10.1109/..
 
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3

Silicon Lifecycle Management: Trends, Challenges and Soluti..:

, In: 2023 IEEE International Test Conference in Asia (ITC-Asia),
Zorian, Yervant - p. 1-1 , 2023
Link: https://doi.org/10.1109/..
 
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4

SLM Subsystem for Automotive SoC: Case Study on Path Margin..:

, In: 2023 IEEE International Test Conference (ITC),
Kandula, Kranthi ; Kolisetti, Ramalingam ; Tshagharyan, Grigor.. - p. 388-392 , 2023
Link: https://doi.org/10.1109/..
 
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5

Utilizing ECC Analytics to Improve Memory Lifecycle Managem..:

, In: 2023 IEEE International Test Conference (ITC),
Argyrides, Costas ; Tshagharyan, Grigor ; Harutyunyan, Gurgen. - p. 383-387 , 2023
Link: https://doi.org/10.1109/..
 
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6

Overcoming Embedded Memory Test & Repair Challenges in the ..:

, In: 2023 IEEE 41st VLSI Test Symposium (VTS),
Ghukasyan, Artur ; Tshagharyan, Grigor ; Harutyunyan, Gurgen. - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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7

On-chip Electromigration Sensor for Silicon Lifecycle Manag..:

, In: 2023 IEEE European Test Symposium (ETS),
Mayahinia, Mahta ; Tahoori, Mehdi ; Tshagharyan, Grigor.. - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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8

Innovative Practices Track: What's Next for Automotive: Whe..:

, In: 2022 IEEE 40th VLSI Test Symposium (VTS),
Peng, Minqiang ; Wu, Youfa ; Li, Jialiang... - p. 1-1 , 2022
Link: https://doi.org/10.1109/..
 
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9

A Novel Protection Technique for Embedded Memories with Opt..:

, In: 2022 IEEE International Test Conference (ITC),
Argyrides, Costas ; Sridharan, Vilas ; Danoyan, Hayk.. - p. 642-645 , 2022
Link: https://doi.org/10.1109/..
 
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10

In-field test solution for enhancing safety in automotive a..:

Abotbol, Yehonatan ; Dror, Shahar ; Tshagharyan, Grigor..
Microelectronics Reliability.  137 (2022)  - p. 114774 , 2022
Link: https://doi.org/10.1016/..
 
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11

Automotive Test and Reliability:

, In: 2021 IEEE International Test Conference in Asia (ITC-Asia),
Huang, Yu ; Francis, David ; Zorian, Yervant. - p. 1-1 , 2021
Link: https://doi.org/10.1109/..
 
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12

Memory Physical Aware Multi-Level Fault Diagnosis Flow:

Harutyunyan, Gurgen ; Martirosyan, Suren ; Shoukourian, Samvel.
IEEE Transactions on Emerging Topics in Computing.  8 (2020)  3 - p. 700-711 , 2020
Link: https://doi.org/10.1109/..
 
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13

Memory FIT Rate Mitigation Technique for Automotive SoCs:

, In: 2019 IEEE International Test Conference (ITC),
Boschi, Gabriele ; Luongo, Donato ; Lazzarotti, Duccio... - p. 1-6 , 2019
Link: https://doi.org/10.1109/..
 
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14

17th IEEE East-West Design and Test Symposium:

, In: 2019 IEEE International Test Conference (ITC),
Zorian, Yervant ; Hahanov, Vladimir ; Chumachenko, Svetlana. - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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15

International Test Conference in Asia (ITC-Asia) - Bridging..:

, In: 2019 IEEE International Test Conference (ITC),
Lee, Kuen-Jong ; Huang, Shi-Yu ; Li, Huawei.. - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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