Zschech, Ehrenfried
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7

Mechanical Robustness of Patterned Structures and Failure M..:

, In: More-than-Moore Devices and Integration for Semiconductors,
 
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10

Mechanical BEoL Robustness Evaluation Using Variable Loadin..:

, In: 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM),
 
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13

Controllable Zeolite AST Crystallization: Between Classical..:

Yue, Qiudi ; Kutukova, Kristina ; Li, Ang...
Chemistry – A European Journal.  28 (2022)  35 - p. , 2022
 
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15

Effect of Copper Line Geometry and Process Parameters on In..:

Zschech, Ehrenfried ; Blum, Werner ; Zienert, Inka.
International Journal of Materials Research.  92 (2022)  7 - p. 803-809 , 2022
 
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