Zwinkels, Joanne
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5

Surface Fluorescence: the Only Standardized Method of Measu..:

, In: Standardization and Quality Assurance in Fluorescence Measurements I; Springer Series on Fluorescence,
Zwinkels, Joanne - p. 163-192 ,
 
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6

Crystallinity, order, the thin-film silicon continuum, and ..:

Moghaddam, Saeed ; Tay, Li-Lin ; Noël, Mario...
Journal of Non-Crystalline Solids.  559 (2021)  - p. 120657 , 2021
 
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7

Thin-film optical function acquisition from experimental me..:

Moghaddam, Saeed ; Cheung, Sin Hang ; Noël, Mario...
Journal of Materials Science: Materials in Electronics.  32 (2021)  13 - p. 17033-17060 , 2021
 
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8

Influence of the growth temperature on the spectral depende..:

Moghaddam, Saeed ; Orapunt, Farida ; Noël, Mario...
Journal of Materials Science: Materials in Electronics.  31 (2020)  16 - p. 13186-13198 , 2020
 
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10

Investigation of converging and collimated beam instrument ..:

Zwinkels, Joanne C. ; Côté, Éric ; Morgan, John
Journal of Physics: Conference Series.  972 (2018)  - p. 012025 , 2018
 
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14

Spectral Fluorescence Measurements:

, In: Experimental Methods in the Physical Sciences; Spectrophotometry - Accurate Measurement of Optical Properties of Materials,
 
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