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de Souza, Michelly
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1

Capacitances and Charge Distribution Analysis in Graded-Cha..:

Oliveira Lopes, Allan ; De Souza, Michelly
Journal of Integrated Circuits and Systems.  19 (2024)  2 - p. 1-6 , 2024
Link: https://doi.org/10.29292..
 
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2

Analytical model for the drain and gate currents in silicon..:

Cerdeira, Antonio ; Estrada, Magali ; de Souza, Michelly.
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields.  37 (2024)  2 - p. , 2024
Link: https://doi.org/10.1002/..
 
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3

Comprehensive evaluation of gate-induced drain leakage in S..:

de Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali...
Solid-State Electronics.  214 (2024)  - p. 108865 , 2024
Link: https://doi.org/10.1016/..
 
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4

High Temperature and Width Influence on the GIDL of Nanowir..:

De Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali...
IEEE Journal of the Electron Devices Society.  11 (2023)  - p. 672-680 , 2023
Link: https://doi.org/10.1109/..
 
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5

Experimental assessment of gate-induced drain leakage in SO..:

de Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali...
Solid-State Electronics.  208 (2023)  - p. 108716 , 2023
Link: https://doi.org/10.1016/..
 
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6

(Digital Presentation) Comparison of Width and Temperature ..:

Pizzanelli, Riccardo ; Prates, Rhaycen ; Pavanello, Marcelo Antonio.
ECS Transactions.  111 (2023)  1 - p. 291-296 , 2023
Link: https://doi.org/10.1149/..
 
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7

Experimental Comparison of Threshold Voltage Extraction Met..:

, In: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro),
Prates, Vinicius Rodrigues ; Pavanello, Marcelo Antonio ; de Souza, Michelly - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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8

Electrical Characterization of Ω-Gate Nanowire MOSFETs Down..:

, In: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro),
Matos, Jefferson Almeida ; de Souza, Michelly ; Casse, Mikael... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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9

Impact of series resistance on the drain current variabilit..:

da Silva, Lucas Mota Barbosa ; Pavanello, Marcelo Antonio ; Cassé, Mikaël...
Solid-State Electronics.  208 (2023)  - p. 108737 , 2023
Link: https://doi.org/10.1016/..
 
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10

Extraction of Drain Current Variability Components in Junct..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
da Silva, Lucas Mota Barbosa ; Pavanello, Marcelo Antonio ; Casse, Mikael... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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11

Comparative of analog performance of transcapacitances in a..:

Alves, Camila Restani ; de Souza, Michelly
Journal of Computational Electronics.  , 2023
Link: https://doi.org/10.1007/..
 
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12

Variability Modeling in Triple-Gate Junctionless Nanowire T..:

Trevisoli, Renan ; Pavanello, Marcelo A. ; Doria, Rodrigo T....
IEEE Transactions on Electron Devices.  69 (2022)  8 - p. 4730-4736 , 2022
Link: https://doi.org/10.1109/..
 
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13

Comparative Analysis of Transcapacitances in Asymmetric Sel..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),
Alves, Camila Restani ; d'Oliveira, Ligia Martins ; de Souza, Michelly - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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14

Performance of SOI Ω-Gate Nanowires fromCryogenic to High T..:

Pavanello, Marcelo Antonio ; De Souza, Michelly
Journal of Integrated Circuits and Systems.  17 (2022)  2 - p. 1-8 , 2022
Link: https://doi.org/10.29292..
 
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15

Analysis of the Gate-Induced Drain Leakage of SOI Nanowire ..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),
de Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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