E-LIB Suche - Ergebnisse für: ter Maten, E

1

Efficient frequency-transient co-simulation of coupled heat..:

Kaufmann, Christof ; Günther, Michael ; Klagges, Daniel...
Journal of Mathematics in Industry. 4 (2014) 1 - p. 1 , 2014

Link: https://doi.org/10.1186/..

2

Behavioral modeling of the dominant dynamics in input-outpu..:

Beelen, T.G.J. ; ter Maten, E.J.W. ; Sihaloho, H.J..
Procedia Computer Science. 1 (2010) 1 - p. 347-355 , 2010

Link: https://doi.org/10.1016/..

3

Nonlinear Model Order Reduction in Nanoelectronics: Combina..:

Bechtold, T. ; Striebel, M. ; Mohaghegh, K..
PAMM. 8 (2008) 1 - p. 10057-10060 , 2008

Link: https://doi.org/10.1002/..

4

Model order reduction for nonlinear problems in circuit sim..:

Verhoeven, A. ; Voss, T. ; Astrid, P...
PAMM. 7 (2007) 1 - p. 1021603-1021604 , 2007

Link: https://doi.org/10.1002/..

5

Stability analysis of the BDF Slowest-first multirate metho..:

Verhoeven, A. ; Ter Maten, E. J. W. ; Mattheij, R. M. M..
International Journal of Computer Mathematics. 84 (2007) 6 - p. 895-923 , 2007

Link: https://doi.org/10.1080/..

6

Time domain analog circuit simulation:

Fijnvandraat, J.G. ; Houben, S.H.M.J. ; ter Maten, E.J.W..
Journal of Computational and Applied Mathematics. 185 (2006) 2 - p. 441-459 , 2006

Link: https://doi.org/10.1016/..

7

Multirate methods for the transient analysis of electrical ..:

Verhoeven, A. ; El Guennouni, A. ; ter Maten, E. J. W..
PAMM. 5 (2005) 1 - p. 821-822 , 2005

Link: https://doi.org/10.1002/..

8

Splitting methods for fourth order parabolic partial differ..:

ter Maten, E. J. W.
Computing. 37 (1986) 4 - p. 335-350 , 1986

Link: https://doi.org/10.1007/..

9

Calibration of Probability Density Function:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,

Dohmen, Jos J. ; Beelen, Theo G. J. ; Dvortsova, Oryna... - p. 401-424 , 2019

Link: https://doi.org/10.1007/..

10

Ageing Models and Reliability Prediction:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,

Gillon, Renaud ; Wieers, Aarnout ; Deleu, Frederik... - p. 425-455 , 2019

Link: https://doi.org/10.1007/..

11

Robust Shape Optimization under Uncertainties in Device Mat..:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,

Putek, Piotr ; ter Maten, E. Jan W. ; Günther, Michael... - p. 223-260 , 2019

Link: https://doi.org/10.1007/..

12

Test Cases for Power-MOS Devices and RF-Circuitry:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,

Janssen, Rick ; Gillon, Renaud ; Wieers, Aarnout... - p. 459-485 , 2019

Link: https://doi.org/10.1007/..

13

Estimating Failure Probabilities:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,

ter Maten, E. Jan W. ; Beelen, Theo G. J. ; Di Bucchianico, Alessandro... - p. 349-379 , 2019

Link: https://doi.org/10.1007/..

14

Nanoelectronic Coupled Problems Solutions

The European Consortium for Mathematics in Industry, 29

ter Maten, E. Jan W ; Brachtendorf, Hans-Georg ; Pulch, Roland.. - 1st ed. 2019 . , 2019

Link: https://doi.org/10.1007/..

15

Fast Fault Simulation for Detecting Erroneous Connections i..:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,

Dohmen, Jos J. ; Tasic, Bratislav ; Janssen, Rick... - p. 381-400 , 2019

Link: https://doi.org/10.1007/..