E-LIB Suche - Ergebnisse für: phy 384

1

Scanning transmission electron microscopy

advanced characterization methods for materials science app...

Bruma, Alina , 2021

Link: https://doi.org/10.1201/..

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Scanning electron microscopy and X-ray microanalysis:

Goldstein, Joseph ; Newbury, Dale E. ; Michael, Joseph R. ; Ritchie, Nicholas W. M... - Fourth edition . , [2018]

Link: https://doi.org/10.1007/..

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Scanning transmission electron microscopy of nanomaterials

basics of imaging and analysis

Tanaka, Nobuo , c 2015

Copies: Zentrale: a phy 384/717

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Structure analysis of advanced nanomaterials

nanoworld by high-resolution electron microscopy

Oku, Takeo , 2014

Link: http://dx.doi.org/10.151..

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Low voltage electron microscopy

principles and applications Royal microscopical society-Wiley series

Bell, David C. ; Erdman, Natasha , 2013

Link: https://onlinelibrary.wi..

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High-Resolution Electron Microscopy:

Spence, John C. H. - 4th ed. . , 2013

Link: https://ebookcentral.pro..

Copies: Zentrale: a phy 384 e/688(4)

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High-resolution electron microscopy:

Spence, John C. H. - 4th edition . , 2013

Copies: Zentrale: a phy 384 e/688(4)

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In-situ electron microscopy

applications in physics, chemistry and materials science

Zweck, Josef ; Dehm, Gerhard ; Howe, James M. , [2012]

Copies: Zentrale: a phy 384/333

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Linear and chiral dichroism in the electron microscope:

Schattschneider, Peter , c 2012

Copies: Zentrale: a phy 384/293

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Electron microscopy XIV

selected, peer reviewed papers from the XIV International C... Solid state phenomena ; 186

Stróż, Danuta , 2012

Copies: Zentrale: a phy 384/155

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Scanning electron microscope optics and spectrometers:

Khursheed, Anjam , 2011

Copies: Zentrale: a phy 384 e/186

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Scanning transmission electron microscopy

imaging and analysis

Nellist, Peter D. ; Pennycook, Stephen J. , 2011

Copies: Zentrale: a phy 384 e/318

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4D electron microscopy

imaging in space and time

Zewail, Ahmed H. , 2010

Copies: Zentrale: a phy 384 e/959

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Scanning electron microscopy and X-ray microanalysis:

Goldstein, Joseph - Third Edition, corrected at the 6th printing . , [2007]

Copies: Zentrale: a phy 384 e/806(3)

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Scanning probe microscopy

atomic scale engineering by forces and currents NanoScience and technology

Foster, Adam , 2006

Copies: Zentrale;