Lewis, Sylvia
385  Ergebnisse:
Personensuche X
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1

Characterizing Sub-micron 3D Defects from Intact Advanced P..:

, In: 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC),
Lau, S.H. ; Gelb, Jeff ; Gul, Sheraz... - p. 530-535 , 2023
 
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4

Revisiting 3D-X-ray for Rapid Reverse Engineering in Large ..:

, In: 2022 IEEE Physical Assurance and Inspection of Electronics (PAINE),
True, John ; Yun, Wenbing ; Gelb, Jeff... - p. 1-6 , 2022
 
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5

In situ visualization of multicomponents coevolution in a b..:

Zan, Guibin ; Qian, Guannan ; Gul, Sheraz...
Proceedings of the National Academy of Sciences.  119 (2022)  29 - p. , 2022
 
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6

Decoupling Sub-micron Resolution and Speed from Sample Size..:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Lau, S.H. ; Gul, Sheraz ; Gelb, Jeff... - p. 1-6 , 2022
 
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7

High-resolution multicontrast tomography with an X-ray micr..:

Zan, Guibin ; Gul, Sheraz ; Zhang, Jin...
Proceedings of the National Academy of Sciences.  118 (2021)  25 - p. , 2021
 
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10

Recent Developments in Laboratory X-ray Microanalytical Tec..:

Lewis, Sylvia ; Gelb, Jeff ; Lau, S.H....
Microscopy and Microanalysis.  26 (2020)  S2 - p. 516-516 , 2020
 
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11

Energy Tunability in Laboratory 3D Nano-XRM:

Gelb, Jeff ; Vine, David ; Lancon, Trevor...
Microscopy and Microanalysis.  25 (2019)  S2 - p. 388-389 , 2019
 
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13

Advancements in X-Ray Analysis for Correlative Microscopy:

Gelb, Jeff ; Lewis, Sylvia ; Lau, SH..
Microscopy and Microanalysis.  24 (2018)  S1 - p. 358-359 , 2018
 
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15

Mapping Subsurface Composition with Attogram Sensitivity us..:

Gelb, Jeff ; Stripe, Benjamin ; Yang, Xiaolin...
Microscopy and Microanalysis.  24 (2018)  S1 - p. 1058-1059 , 2018
 
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