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Statistical pattern recognition
Spartan books ; 9210
Chen, Chi-hau
, 1973
Exemplar:
Zentrale:Magazin
03.f.3325
RT Book, Whole T1 <Title>Statistical pattern recognition</Title> UL https://suche.suub.uni-bremen.de/peid=B02073004&Exemplar=1&LAN=DE A1 Chen, Chi-hau PB Hayden PP Rochelle Park/N.J. YR 1973 NO 236 S T3 Spartan books ; 9210 SN 0876711778 SN 9780876711774 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=17155572* CN Magazin: 03.f.3325 SF ELIB - SuUB Bremen
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