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1 Ergebnisse
1
Experimental aspects
, In:
Point defects in semiconductors / M. Lannoo; J. Bourgoin
2
,
Springer series in solid-state sciences ; 35
Bourgoin, Jacques
;
Lannoo, Michel
;
Watkins, G. D.
, 1983
Exemplar:
Zentrale:E02
a phy 933.8 e/089-2
RT Book, Whole T1 <cTitle>Point defects in semiconductors / M. Lannoo; J. Bourgoin<br>2</cTitle>: T1 <Title>Experimental aspects</Title> UL https://suche.suub.uni-bremen.de/peid=B02857338&Exemplar=1&LAN=DE A1 Bourgoin, Jacques A1 Lannoo, Michel A1 Watkins, G. D. PB Springer PP Berlin [u.a.] YR 1983 NO XVI, 295 S : graph. Darst T3 Springer series in solid-state sciences ; 35 SN 3540115153 SN 0387115153 SN 9780387115153 VO 2 VO 35 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=59156867* CN E02: a phy 933.8 e/089-2 SF ELIB - SuUB Bremen
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