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1 Ergebnisse
1
20 nm-Resolved Stress Profile in SiGe Nano-Stripes Obtained..:
, In:
Handbook of enhanced spectroscopy / edited by Pietro Giuseppe Gucciardi, Marc Lamy de la Chapelle, Nathalie Lidgi-Guigui
Chaigneau, Marc
;
Vanacore, Giovanni Maria
;
Bollani, Monica
.... (2016) - p. 415-442
Exemplar:
Zentrale:
a phy 765/299
RT Journal Article T1 <Title>20 nm-Resolved Stress Profile in SiGe Nano-Stripes Obtained by Tip-Enhanced Raman Spectroscopy</Title> UL https://suche.suub.uni-bremen.de/peid=B102662254&Exemplar=1&LAN=DE A1 Chaigneau, Marc A1 Vanacore, Giovanni Maria A1 Bollani, Monica A1 Picardi, Gennaro A1 Tagliaferri, Alberto A1 Ossikovski, Razvigor YR 2016 JF Handbook of enhanced spectroscopy / edited by Pietro Giuseppe Gucciardi, Marc Lamy de la Chapelle, Nathalie Lidgi-Guigui SP 415 OP 442 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=1583443991* CN Zentrale: a phy 765/299 SF ELIB - SuUB Bremen
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