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1 Ergebnisse
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Field effect transistor based CMOS stress sensors
MEMS technology and engineering ; 2
Dölle, Michael
, 2006
Exemplar:
Zentrale:Magazin
01.p.6483
RT Dissertation/Thesis T1 <Title>Field effect transistor based CMOS stress sensors</Title> UL https://suche.suub.uni-bremen.de/peid=B132253548&Exemplar=1&LAN=DE A1 Dölle, Michael PB Der Andere Verl. PP Tönning YR 2006 NO IV, 211 S. : Ill., graph. Darst. T3 MEMS technology and engineering ; 2 SN 3899594584 SN 9783899594584 SN 9783899594584 VO 2 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=80061552* CN Magazin: 01.p.6483 SF ELIB - SuUB Bremen
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