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1 Ergebnisse
1
Dependability in electronic systems
mitigation of hardware failures, soft errors, and electro-m...
Kanekawa, Nobuyasu
;
Ibe, Eishi H.
;
Suga, Takashi
. , 2011
Exemplar:
Zentrale:E02
a elt 610.2 e/001
RT Book, Whole T1 <Title>Dependability in electronic systems</Title> : <SubTitle>mitigation of hardware failures, soft errors, and electro-magnetic disturbances</SubTitle> UL https://suche.suub.uni-bremen.de/peid=B160723355&Exemplar=1&LAN=DE A1 Kanekawa, Nobuyasu A1 Ibe, Eishi H. A1 Suga, Takashi A1 Uematsu, Yutaka PB Springer New York PP New York, NY [u.a.] YR 2011 NO X, 204 S. ; 235 mm x 155 mm : Ill., graph. Darst. SN 9781441967145 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=1256805300* CN E02: a elt 610.2 e/001 SF ELIB - SuUB Bremen
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