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1 Ergebnisse
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VLSI Design and Test
23rd International Symposium, VDAT 2019, Indore, India, Jul... Communications in Computer and Information Science ; 1066;Springer eBook Collection;Springer eBooks, Computer Science
Sengupta, Anirban
;
Dasgupta, Sudeb
;
Singh, Virendra
.. - 1st ed. 2019 . , 2019
Link:
https://doi.org/10.1007/978-981-32-9767-8
RT Book, Whole T1 <Title>VLSI Design and Test</Title> : <SubTitle>23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers</SubTitle> UL https://suche.suub.uni-bremen.de/peid=B167631824&Exemplar=1&LAN=DE A1 Sengupta, Anirban A1 Dasgupta, Sudeb A1 Singh, Virendra A1 Sharma, Rohit A1 Kumar Vishvakarma, Santosh NO 1st ed. 2019 PB Springer PP Singapore YR 2019 NO 1 Online-Ressource (XVI, 775 p. 545 illus., 336 illus. in color) T3 Communications in Computer and Information Science ; 1066 T3 Springer eBook Collection T3 Springer eBooks, Computer Science SN 9789813297678 LK http://dx.doi.org/https://doi.org/10.1007/978-981-32-9767-8 DO https://doi.org/10.1007/978-981-32-9767-8 LK http://dx.doi.org/10.1007/978-981-32-9767-8 DO 10.1007/978-981-32-9767-8 LK http://https://doi.org/10.1007/978-981-32-9767-8 SF ELIB - SuUB Bremen
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