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1 Ergebnisse
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Reliability and degradation mechanisms of GaN high electron..:
Kemmer, Tobias
, [2021?]
Link:
https://nbn-resolving.de/urn:nbn:de:bsz:25-freidok-223..
RT Book, Whole T1
Reliability and degradation mechanisms of GaN high electron mobility transistors with short gate length
UL https://suche.suub.uni-bremen.de/peid=B178840816&Exemplar=1&LAN=DE A1 Kemmer, Tobias PB Albert-Ludwigs-Universität Freiburg im Breisgau PP Freiburg YR 2021 NO 1 Online-Ressource (XIII, 160 Seiten) : Illustrationen, Diagramme LK http://dx.doi.org/https://doi.org/10.6094/UNIFR/223879 DO https://doi.org/10.6094/UNIFR/223879 LK http://dx.doi.org/https://nbn-resolving.org/urn:nbn:de:bsz:25-freidok-2238799 DO https://nbn-resolving.org/urn:nbn:de:bsz:25-freidok-2238799 LK http://dx.doi.org/10.6094/UNIFR/223879 DO 10.6094/UNIFR/223879 LK http://https://nbn-resolving.de/urn:nbn:de:bsz:25-freidok-2238799 SF ELIB - SuUB Bremen
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