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1 Ergebnisse
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Semiconductor devices
testing and evaluation
Jowett, Charles Eric
, 1974
Exemplar:
Zentrale:Magazinturm E02
a elt 660/475
RT Book, Whole T1 <Title>Semiconductor devices</Title> : <SubTitle>testing and evaluation</SubTitle> UL https://suche.suub.uni-bremen.de/peid=B19708605&Exemplar=1&LAN=DE A1 Jowett, Charles Eric PB Business Books PP London YR 1974 NO XII, 134 S SN 0220662215 SN 9780220662219 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=18361150* CN Magazinturm E02: a elt 660/475 SF ELIB - SuUB Bremen
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