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Secondary ion mass spectrometry
proceedings of the Eleventh International Conference on Sec...
Gillen, Greg
, 1998
Exemplar:
Zentrale:E02
a che 193 i/644-11
RT Book, Whole T1 <Title>Secondary ion mass spectrometry</Title> : <SubTitle>proceedings of the Eleventh International Conference on Secondary Ion Mass Spectrometry, SIMS XI, Orlando, Florida, September 7 - 12th, 1997</SubTitle> UL https://suche.suub.uni-bremen.de/peid=B23736952&Exemplar=1&LAN=DE A1 Gillen, Greg PB Wiley PP Chichester [u.a.] YR 1998 NO XXXII, 1118 S : Ill., graph. Darst SN 0471978264 SN 9780471978268 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=29047129* CN E02: a che 193 i/644-11 SF ELIB - SuUB Bremen
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