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1 Ergebnisse
1
The impact of clustered defect distributions in IC fabricat..:
, In:
Management science
Albin, Susan L.
;
Friedman, David J.
. (1989) 9 - p. 1066-1078
Exemplar:
Zentrale
;
RT Journal Article T1 <Title>The impact of clustered defect distributions in IC fabrication</Title> UL https://suche.suub.uni-bremen.de/peid=B25952836&Exemplar=1&LAN=DE A1 Albin, Susan L. A1 Friedman, David J. YR 1989 NO : Graph. Darst JF Management science VO 35 IS 9 SP 1066 OP 1078 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=12602966* CN Zentrale: z bwl 001 jc/975 CN Magazin Zs: fb 9975 CN ZS-Lesesaal: bwl 002 CN Magazin Zs: fb 9975 SF ELIB - SuUB Bremen
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