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1 Ergebnisse
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Defect recognition and image processing in semiconductors 1..
proceedings of the sixth international conference held in B... Institute of Physics conference series ; 149
Mickelson, Alan Rolf
, 1996
Exemplar:
Zentrale:Magazinturm E02
h phy 939.6 i/334-6;
Zentrale:Magazin
01.b.8232
RT Book, Whole T1
Defect recognition and image processing in semiconductors 1995
:
proceedings of the sixth international conference held in Boulder, Colorado, 3 - 6 December 1995 ; [Defect Recognition and Image Processing (DRIP) Conference]
UL https://suche.suub.uni-bremen.de/peid=B27316142&Exemplar=1&LAN=DE A1 Mickelson, Alan Rolf PB Inst. of Physics Publ. PP Bristol [u.a.] YR 1996 NO XII, 369 S. : Ill., graph. Darst. T3 Institute of Physics conference series ; 149 SN 0-7503-0372-7 SN 9780750303729 VO 149 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=22152834* CN Magazinturm E02: h phy 939.6 i/334-6 CN Magazin: 01.b.8232 SF ELIB - SuUB Bremen
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