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1 Ergebnisse
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Defect recognition and image processing in semiconductors a..
proceedings of the fifth international conference, Santande... Institute of Physics conference series ; 135
Jiménez, J.
, 1994
Exemplar:
Zentrale:Magazinturm-E02
15h phy 939.6 i/334-5
RT Book, Whole T1 <Title>Defect recognition and image processing in semiconductors and devices</Title> : <SubTitle>proceedings of the fifth international conference, Santander, Spain, 6-10 September 1993</SubTitle> UL https://suche.suub.uni-bremen.de/peid=B27316182&Exemplar=1&LAN=DE A1 Jiménez, J. PB Institute of Physics Publ PP Bristol [u.a.] YR 1994 NO XX, 417 S : Ill., graph. Darst T3 Institute of Physics conference series ; 135 SN 0750302941 SN 9780750302944 VO 135 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=16694682* CN Magazinturm-E02: 15h phy 939.6 i/334-5 SF ELIB - SuUB Bremen
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