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The role of microscopy in semiconductor failure analysis
Microscopy handbooks ; 25;Oxford science publications
Richards, B. P.
;
Footner, P. K.
, 1992
Exemplar:
Zentrale:Magazin
01.b.1883
RT Book, Whole T1 <Title>The role of microscopy in semiconductor failure analysis</Title> UL https://suche.suub.uni-bremen.de/peid=B27536150&Exemplar=1&LAN=DE A1 Richards, B. P. A1 Footner, P. K. PB Oxford Univ. Press PP Oxford [u.a.] YR 1992 NO VI, 108 S. : Ill., graph. Darst. T3 Microscopy handbooks ; 25 T3 Oxford science publications SN 0198564325 SN 9780198564324 VO 25 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=16608761* CN Magazin: 01.b.1883 SF ELIB - SuUB Bremen
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