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1 Ergebnisse
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Reliability of electron devices, failure physics and analys..
Microelectronics reliability ; 41.2001,9/10, Special issue
Touboul, André
, 2001
Exemplar:
Zentrale:Magazin Zs
fc 3211-41,2
RT Book, Whole T1 <Title>Reliability of electron devices, failure physics and analysis</Title> UL https://suche.suub.uni-bremen.de/peid=B33532915&Exemplar=1&LAN=DE A1 Touboul, André PB Pergamon PP Oxford YR 2001 NO VIII S., S. 1274-1736 T3 Microelectronics reliability ; 41.2001,9/10, Special issue LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=57525001* CN Magazin Zs: fc 3211-41,2 SF ELIB - SuUB Bremen
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