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1 Ergebnisse
1
Development of a traceable atomic force microscope:
, In:
Technisches Messen
Chen, Chao-Jung
;
Hofmann, Norbert
;
Jäger, Gerd
. (2002) 11 - p. 483-487
Exemplar:
Zentrale
;
RT Journal Article T1 <Title>Development of a traceable atomic force microscope</Title> UL https://suche.suub.uni-bremen.de/peid=B48293270&Exemplar=1&LAN=DE A1 Chen, Chao-Jung A1 Hofmann, Norbert A1 Jäger, Gerd YR 2002 JF Technisches Messen VO 69 IS 11 SP 483 OP 487 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=12592814* CN Zentrale: z ing 111 ja/273 CN ZS-Lesesaal: ing 022 CN Magazin Zs: fb 3273 SF ELIB - SuUB Bremen
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