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Atomic force microscopy, scanning nearfield optical microsc..
application to rough and natural surfaces NanoScience and technology
Kaupp, Gerd
, 2006
Exemplar:
Zentrale:
a phy 957.6 e/324
RT Book, Whole T1
Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching
:
application to rough and natural surfaces
UL https://suche.suub.uni-bremen.de/peid=B49595988&Exemplar=1&LAN=DE A1 Kaupp, Gerd PB Springer PP Berlin YR 2006 NO XII, 292 S. ; 24 cm : Ill., graph. Darst. T3 NanoScience and technology SN 3540284052 SN 9783540284055 SN 9783540284055 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=77903153* CN Zentrale: a phy 957.6 e/324 SF ELIB - SuUB Bremen
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