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Electromechanical resonances of SiC and AIN beams under amb..:

, In: Mechanical engineering from macro to nano / Technische Universität Ilmenau, Faculty of Mechanical Engineering. [Hrsg.: Peter Scharff]
Brückner, Klemens ; Förster, Christian ; Tonisch, Katja.... (2005)  - p. 209-210
Exemplar:  Zentrale:Magazin 01.r.4949