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1 Ergebnisse
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VLSI test principles and architectures
design for testability The Morgan Kaufmann series in systems on silicon
Wang, Laung-Terng
;
Wu, Cheng-Wen
, 2006
Exemplar:
:TB Technik
n 466/74;
Zentrale:E02
a inf 130 m/914
RT Book, Whole T1 <Title>VLSI test principles and architectures</Title> : <SubTitle>design for testability</SubTitle> UL https://suche.suub.uni-bremen.de/peid=B50918023&Exemplar=1&LAN=DE A1 Wang, Laung-Terng A1 Wu, Cheng-Wen PB Elsevier PP Amsterdam YR 2006 NO XXX, 777 S : Ill., graph. Darst T3 The Morgan Kaufmann series in systems on silicon SN 0123705975 SN 9780123705976 SN 9780123705976 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=81170047* CN TB Technik: n 466/74 CN E02: a inf 130 m/914 SF ELIB - SuUB Bremen
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