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1 Ergebnisse
1
Raster-Sonden-Mikroskopie mit Cantilever-Arrays:
, In:
Technisches Messen
Sarov, Yanko
;
Ivanova, Katerina
;
Filenko, Denis
.... (2006) 9 - p. 485-492
Exemplar:
Zentrale
;
RT Journal Article T1 <Title>Raster-Sonden-Mikroskopie mit Cantilever-Arrays</Title> UL https://suche.suub.uni-bremen.de/peid=B51930386&Exemplar=1&LAN=DE A1 Sarov, Yanko A1 Ivanova, Katerina A1 Filenko, Denis A1 Nikolov, Nikolaj A1 Zier, Michael A1 Gotszalk, Teodor A1 Sulzbach, Thomas A1 Rangelow, Ivo W. A1 Volland, Burkhard E. A1 Dontsov, Denis A1 Persaud, Arun A1 Schmidt, Bernd YR 2006 JF Technisches Messen VO 73 IS 9 SP 485 OP 492 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=12592814* CN Zentrale: z ing 111 ja/273 CN ZS-Lesesaal: ing 022 CN Magazin Zs: fb 3273 SF ELIB - SuUB Bremen
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