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1 Ergebnisse
1
Analysis and design of resilient VLSI circuits
mitigating soft errors and process variations
Garg, Rajesh
;
Khatri, Sunil P.
, 2010
Exemplar:
Zentrale:E02
a inf 110 e/733
RT Book, Whole T1 <Title>Analysis and design of resilient VLSI circuits</Title> : <SubTitle>mitigating soft errors and process variations</SubTitle> UL https://suche.suub.uni-bremen.de/peid=B60053894&Exemplar=1&LAN=DE A1 Garg, Rajesh A1 Khatri, Sunil P. PB Springer PP New York, NY [u.a.] YR 2010 NO XXII, 212 S. ; 240 mm x 162 mm : Ill., graph. Darst. SN 9781441909305 LK http://katalog.suub.uni-bremen.de/DB=1/LNG=DU/CMD?ACT=SRCHA&IKT=8000&TRM=94397312* CN E02: a inf 110 e/733 SF ELIB - SuUB Bremen
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